Monday, December 12, 2011

PDF Ebook Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha

PDF Ebook Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha

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Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha

Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha


Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha


PDF Ebook Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha

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Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha

Urology In-Service and Board Review - The Essential and Concise Study Guide is designed to help improve urology residents' in-service scores and to provide a concise review for busy urologists who plan to take the board examinations. The authors expertly condense the essential urological concepts into a single, reliable reference source. Every aspect of this study guide was designed to achieve rapid results in the shortest amount of time. Most material is presented in a bullet point format so that the reader can gather high-yield information without being bogged down by minutiae. Bold and italicized text draws attention to important topics, while "High-Yield Boxes" highlight vital information. 100+ tables and figures condense complex information to improve memory recall during actual testing situations. Complex disease treatment algorithms, such as testicular and prostate cancer, are included.

  • Sales Rank: #66154 in Books
  • Published on: 2013-09-07
  • Original language: English
  • Number of items: 1
  • Dimensions: 10.00" h x 1.04" w x 7.01" l, 1.96 pounds
  • Binding: Paperback
  • 518 pages

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Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha PDF

Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha PDF
Urology In-Service and Board Review - The Essential and Concise Study GuideBy Jason D. Fisher, Tarek Pacha PDF

Thursday, December 1, 2011

PDF Ebook A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten

PDF Ebook A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten

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A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten

A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten


A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten


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A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten

A one-stop, concise guide on determining and measuring thin film thickness by optical methods.

This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods.

Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon.

Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.

  • Sales Rank: #3779366 in Books
  • Brand: Brand: Wiley-VCH
  • Published on: 2012-11-28
  • Original language: English
  • Number of items: 1
  • Dimensions: 9.50" h x .54" w x 6.80" l, 1.05 pounds
  • Binding: Paperback
  • 224 pages
Features
  • Used Book in Good Condition

Review

“A one-stop, concise guide on determining and measuring thin film thickness by optical methods.”  (The German Branch of the European Optical Society, 1 November 2013)

“It would be a useful read for industrial and academic researchers, engineers, developers and manufacturers in areas of optical layer and thin optical film measurement and metrology.”  (Optics & Photonics News, 1 November 2013)

From the Back Cover

This book presents a comprehensive overview of optical metrology for thin film thickness determination by optical means, from electrodynamic basics, and hardware components, to methods of measurement and evaluation. The author, an expert in the field with both academic and industrial experience, concentrates on the spectral reflectance measurement with miniaturized spectrometers, one of the most flexible techniques for inline and offline thickness determination.

About the Author
Dr. Michael Quinten works as Head of Research and Development Sensors at FRT GmbH in Bergisch Gladbach, Germany. Having obtained his diploma degree and Ph. D. in physics (1989) at the University of Saarland, Saarbruecken, Germany, he joined the Technical University RWTH Aachen in 1990 to work as a physics fessor. He then spent four years at several universities in Graz (Austria), Chemnitz, Aachen, Saarbruecken and Bochum (Germany). During his academic career, he authored 50 scientific publications on optical properties of nanoparticles, nanoparticle materials, and aerosols. In 2001, he joined the ETA-Optik GmbH, Germany, where he first worked in research and development of integrated optics components, and later became a product manager in the Colour and Coatings Division. During this period, he became expert in optical layer thickness determination. In 2007, he moved to FRT GmbH where he is responsible for the optical sensor technology division. He is the author of Optical Properties of Nanoparticle Systems: Mie and Beyond, Hardcover, 502 pages, Publisher: Wiley-VCH; 1 edition (March 15, 2011), ISBN10: 9783527410439, ISBN-13: 978-3527410439.

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A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten PDF

A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten PDF

A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten PDF
A Practical Guide to Optical Metrology for Thin FilmsBy Michael Quinten PDF